ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,932, issued on Sept. 15, was assigned to Sharp Semiconductor Innovation Corp. (Tenri City, Japan).
"Temperature measuring circuit" was invented by Takeshi Mitsunaka (Tenri City, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A temperature measuring circuit includes: a first switch circuit configured to charge a capacitor upon receiving a first control signal and discharge the capacitor upon receiving a second control signal; a control circuit configured to set a control signal at a second control signal in response to an output voltage indicating that an inter-terminal voltage is higher than a first reference voltage, set the control signal a...