US Patent Issued to SHANGHAI YANDING TECH on July 14 for "Device and system for testing camera in high and low temperature environments" (Chinese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,684,111, issued on July 14, was assigned to SHANGHAI YANDING TECH Co. LTD (Shanghai).

"Device and system for testing camera in high and low temperature environments" was invented by Jeongkeun Chae (Shanghai) and Qingchun Wang (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "A device and system for testing a camera in high and low temperature environments. The device includes: a high and low temperature cabinet, a parallel light tube component, a test piece, a test box, a first positioning table, and a second positioning table, where the high and low temperature cabinet is connected to the test box, the test box is arranged on the first positioni...