US Patent Issued to Shanghai Institute of Technical Physics, Chinese Academy of Sciences on Aug. 4 for "Absolute measurement method for the phase of the complex coherence coefficient" (Chinese Inventor)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,698,959, issued on Aug. 4, was assigned to Shanghai Institute of Technical Physics, Chinese Academy of Sciences (Shanghai).

"Absolute measurement method for the phase of the complex coherence coefficient" was invented by Qinghua Yu (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for absolute phase measurement for complex coherence coefficient of an object comprises: firstly, processing fringe data measured by interferometry on any aperture pairs of an equivalent pupil plane of an optical imaging system to obtain an interference term and envelope and extreme values thereof; secondly, selecting extreme value A of light intensity from an i...