US Patent Issued to SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION on May 19 for "Transformer malfunction diagnosis device and malfunction diagnosis method using same" (South Korean Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,615, issued on May 19, was assigned to SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION (Seoul, South Korea).

"Transformer malfunction diagnosis device and malfunction diagnosis method using same" was invented by Sun Uwe Kim (Seoul, South Korea), Byeng Dong Youn (Seoul, South Korea), Soo Ho Jo (Seoul, South Korea), Jong Min Park (Seoul, South Korea) and Won Gon Kim (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention provides a transformer malfunction diagnostic device and a malfunction diagnosis method using same, wherein a rule-based learning method is combined with a deep-learning-based learning method based on artific...