US Patent Issued to SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION, SEOUL NATIONAL UNIVERSITY HOSPITAL on March 24 for "Methods and apparatus for analyzing pathology patterns of whole-slide images based on graph deep learning" (South Korean Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,586,184, issued on March 24, was assigned to SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION (Seoul, South Korea) and SEOUL NATIONAL UNIVERSITY HOSPITAL (Seoul, South Korea).

"Methods and apparatus for analyzing pathology patterns of whole-slide images based on graph deep learning" was invented by Sunghoon Kwon (Seoul, South Korea), Yongju Lee (Goyang-si, South Korea), Kyoungseob Shin (Goyang-si, South Korea), Kyung Chul Moon (Seoul, South Korea), Jeong Hwan Park (Seoul, South Korea) and Sohee Oh (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention relates to a method and apparatus for analyzing pathology patterns of whole...