ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,562, issued on Sept. 15, was assigned to SEMILAB SEMICONDUCTOR PHYSICS LABORATORY Co. LTD. (Budapest, Hungary).
"Mercury probe apparatus with improved safety" was invented by Attila Marton (Budapest, Hungary).
According to the abstract* released by the U.S. Patent & Trademark Office: "An semiconductor wafer measurement apparatus includes a holder; a probe with a capillary tube containing a mercury column for contacting a wafer with the column; a pneumatic control means applying a partial vacuum or pressure above the column; a probe arm affixed to the probe; a positioning means controlling the position of the tube relative to the wafer; a measurement means causing a current throu...