US Patent Issued to SEMICONDUCTOR COMPONENTS INDUSTRIES on April 14 for "Built-in self-test circuit and method for deadtime trimming" (Italian Inventor)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,781, issued on April 14, was assigned to SEMICONDUCTOR COMPONENTS INDUSTRIES LLC (Scottsdale, Ariz.).

"Built-in self-test circuit and method for deadtime trimming" was invented by Andrea Bollati (Parabiago, Italy).

According to the abstract* released by the U.S. Patent & Trademark Office: "Illustrative test circuits and methods are provided for determining deadtime of a switched power supply (SPS) driver. The test circuit can be configured to couple a selected gate signal selected from a high side gate signal of a driver and a low side gate signal of the driver to an input of the driver via a feedback path that causes the selected gate signal to oscillate with a period indicativ...