US Patent Issued to SEMES on June 23 for "Probe card test system and method" (South Korean Inventor)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,495, issued on June 23, was assigned to SEMES Co. LTD. (Chungcheongnam-Do, South Korea).

"Probe card test system and method" was invented by Harkryong Kim (Chungcheongnam-do, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a probe card test system and method, the probe card test system including a loader for loading and placing a probe card for testing electrical properties of a substrate, on a holder, an inverter for transferring the probe card placed on the holder, to a preliminary position by inverting the probe card, a transferer for transferring the probe card transferred to the preliminary position, to a test table, a te...