US Patent Issued to SEIKO EPSON on March 24 for "Inertial measurement device and method for manufacturing inertial measurement device" (Japanese Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,584,741, issued on March 24, was assigned to SEIKO EPSON Corp. (Japan).

"Inertial measurement device and method for manufacturing inertial measurement device" was invented by Toru Watanabe (Matsumoto, Japan) and Hiroyuki Ogiso (Ina, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inertial measurement device includes: a substrate having a joining area; a cap; a sensor device accommodated in a resin package and disposed in a mounting area on the substrate in an internal space between the substrate and the cap; and a sealing material and a joining material configured to join the cap to the substrate in the joining area of the substrate. The joinin...