US Patent Issued to SEIKO EPSON on Aug. 4 for "Method of extracting unsuitable and defective data from plurality of pieces of training data used for learning of machine learning model, information processing device, and non-transitory computer-readable storage medium storing computer program" (Japanese Inventor)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,700,223, issued on Aug. 4, was assigned to SEIKO EPSON Corp. (Tokyo).

"Method of extracting unsuitable and defective data from plurality of pieces of training data used for learning of machine learning model, information processing device, and non-transitory computer-readable storage medium storing computer program" was invented by Hikaru Kurasawa (Matsumoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method according to the present disclosure includes selecting a reference class from a plurality of classes, calculating a plurality of degrees of similarity between a feature spectrum corresponding to target training data and a plurality of the...