ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,769, issued on July 7, was assigned to SEETHRU AI INC. (Chelmsford, Mass.).
"X-ray scanning system and method for inspecting an object" was invented by Omar Al-Kofahi (Chelmsford, Mass.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Presently disclosed is an x-ray scanning system and method for inspecting an object. The system has a first mobile x-ray scanner configured for scatter imaging and to generate a first compilation of scan data of a first side of the object. A second x-ray scanner is configured for imaging and generating a second compilation of scan data of a second side of the object. A movement device is configured and disposed to move at...