ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,694, issued on June 30, was assigned to SCOPIO LABS LTD. (Tel Aviv, Israel).
"Accelerating digital microscopy scans using empty/dirty area detection" was invented by Ittai Madar (Tel Aviv, Israel), Eran Small (Yehud, Israel), Itai Hayut (Tel Aviv, Israel) and Erez Na'Aman (Tel Aviv, Israel).
According to the abstract* released by the U.S. Patent & Trademark Office: "A microscope including an illumination assembly, an image capture device and a processor can be configured to selectively identify regions of a sample including artifacts or empty space. By selectively identifying regions of the sample that have artifacts or empty space, the amount of time to generate an image of the ...