US Patent Issued to Schlumberger Technology on May 12 for "Machine learning-based defect analysis reporting and tracking" (Indian, Chinese, American Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,353, issued on May 12, was assigned to Schlumberger Technology Corp. (Sugar Land, Texas).

"Machine learning-based defect analysis reporting and tracking" was invented by Sunil Manikani (Pune, India), Olga Domanova (Beijing), Krishna Kumar Narayanan Nair (Pune, India), Federico Sporleder (Pune, India), Ali Rezaei (Houston) and Nasser Ghorbani (Houston).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and computer program products are provided for defect detection in industrial inspections. In one embodiment, captured images are ingested from a robotic platform equipped with imaging sensors. The ingested images are analyzed using an imag...