US Patent Issued to SCHLUMBERGER TECHNOLOGY on March 17 for "Resistivity imaging using EM propagation measurements" (American, Malaysian Inventors)

ALEXANDRIA, Va., March 17 -- United States Patent no. 12,578,497, issued on March 17, was assigned to SCHLUMBERGER TECHNOLOGY Corp. (Sugar Land, Texas).

"Resistivity imaging using EM propagation measurements" was invented by Gong Li Wang (Sugar Land, Texas), Dean Homan (Damon, Texas), Kong Hauw Sarwa Bakti Tan (Sugar Land, Texas), Xiaoyan Zhong (Sugar Land, Texas), Keli Sun (Sugar Land, Texas), Ettore Mirto (Petaling Jaya, Malaysia) and Kent David Harms (Richmond, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "Techniques and systems for generating resistivity images. A system includes an electromagnetic (EM) logging tool configured to generate EM propagation measurements during a drilling operation. Th...