US Patent Issued to Scenera on Aug. 11 for "Curation of custom workflows using multiple cameras, with AI trained from the workflow" (Dutch, American Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,110, issued on Aug. 11, was assigned to Scenera Inc. (Palo Alto, Calif.).

"Curation of custom workflows using multiple cameras, with AI trained from the workflow" was invented by David D. Lee (Palo Alto, Calif.) and Andrew Augustine Wajs (Haarlem, Netherlands).

According to the abstract* released by the U.S. Patent & Trademark Office: "A multi-layer technology stack includes a sensor layer including image sensors, a device layer, and a cloud layer, with interfaces between the layers. A method to curate different custom workflows for multiple applications include the following. Requirements for custom sets of data packages for the applications is received. The custom set of data p...