US Patent Issued to Scantech (Hangzhou) on Sept. 1 for "Three-dimensional scanning system and three-dimensional scanning method" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,725,299, issued on Sept. 1, was assigned to Scantech (Hangzhou) Co LTD (Hangzhou, China).

"Three-dimensional scanning system and three-dimensional scanning method" was invented by Jiangfeng Wang (Hangzhou, China), Shangjian Chen (Hangzhou, China), Bing Ye (Hangzhou, China), Zhaolong Wang (Hangzhou, China) and Jun Zheng (Hangzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A three-dimensional scanning system includes a scanning apparatus configured to acquire first raw image data of a scanning target. The three-dimensional scanning system further includes a first field programmable gate array (FPGA) module provided in the scanning apparatus and...