US Patent Issued to SAP on May 26 for "Generating minority class defect detection data from visual inspection dataset using self-supervised defect generator" (Singaporean Inventors)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,639,804, issued on May 26, was assigned to SAP SE (Walldorf, Germany).

"Generating minority class defect detection data from visual inspection dataset using self-supervised defect generator" was invented by Yinan He (Singapore), Xinyan Chen (Singapore), Rajesh Vellore Arumugam (Singapore) and Anantharaman Ravi (Singapore).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and computer-readable storage media for a defect detection system that generates synthetic defect data that is representative of real-world defects in products. The synthetic defect data is included in training data for training a defect detection model. The defect detectio...