US Patent Issued to SAP on June 9 for "Semantic feature extraction for auto-labeling of defects" (Singaporean Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,651,331, issued on June 9, was assigned to SAP SE (Walldorf, Germany).

"Semantic feature extraction for auto-labeling of defects" was invented by Xinyan Chen (Singapore), Yinan He (Singapore), Junxiang Jia (Singapore) and Anantharaman Ravi (Sinapore, Singapore).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods described herein relate to semantic feature extraction for auto-labeling of defects. An image is processed to obtain structured text data describing a target defect of an item appearing in the image. The structured text data is processed to convert the structured text data into a target embedding associated with the target defect. T...