US Patent Issued to SAP on July 7 for "Zero-shot referring segmentation for defect detection in visual inspection with LLM-generated prompts" (Singaporean Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,675,871, issued on July 7, was assigned to SAP SE (Walldorf, Germany).

"Zero-shot referring segmentation for defect detection in visual inspection with LLM-generated prompts" was invented by Xinyan Chen (Singapore), Yinan He (Singapore), Rajesh Vellore Arumugam (Singapore) and Anantharaman Ravi (Singapore).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and computer-readable storage media for receiving a product image depicting a product that is to-be-inspected for defects, transmitting a request to a LLM system, the request including the product image and a reference image, receiving, from the LLM system, a textual response, the textual ...