ALEXANDRIA, Va., March 3 -- United States Patent no. 12,566,147, issued on March 3, was assigned to SANECHIPS TECHNOLOGY Co. LTD. (Guangdong, China).

"Test apparatus and method" was invented by Niuyi Sun (Guangdong, China), Dan Yang (Guangdong, China), Na Mei (Guangdong, China) and Tuobei Sun (Guangdong, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a test apparatus, including: a connection circuit having a plurality of mounting positions each configured to connect a sample; a detection unit configured to perform a detection on the sample; and a control unit configured to control the detection unit to perform the detection on the sample. Further disclosed is a test method, including: conn...