US Patent Issued to Sandisk Technologies on May 26 for "Low error rate read operation in multi-module arrays" (California Inventors)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,640,181, issued on May 26, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).

"Low error rate read operation in multi-module arrays" was invented by Kadriye Deniz Bozdag (Sunnyvale, Calif.), Juan Saenz (Menlo Park, Calif.), Mark Lin (Santa Clara, Calif.), Dimitri Houssameddine (Sunnyvale, Calif.), Mario Laudato (Santa Clara, Calif.), Nicolas Irizarry (Folsom, Calif.) and Ashraf B. Islam (El Dorado Hills, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Technology for reading memory cells in a cross-point architecture. A memory system reads one memory cell in each module in parallel. The memory system performs two reads of the memory cells...