US Patent Issued to Sandisk Technologies on March 3 for "Pre-characterizing weak bits for increased low density parity check (LDPC) speed" (Israeli, American Inventors)

ALEXANDRIA, Va., March 3 -- United States Patent no. 12,567,475, issued on March 3, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).

"Pre-characterizing weak bits for increased low density parity check (LDPC) speed" was invented by Adam Jacobvitz (San Jose, Calif.), Piyush Dhotre (San Jose, Calif.), Niles Yang (San Jose, Calif.), Juan Carlos Lee (San Jose, Calif.), Eran Sharon (Rishon Lezion, Israel), Idan Goldenberg (Rishon Lezion, Israel) and Zhenni Wan (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A storage device may speed up error correction by pre-characterizing weak cell information in a memory device. The storage device includes a memory device with cells that may stor...