US Patent Issued to Sandisk Technologies on March 24 for "Estimating peak source current using memory die substrate temperature detection" (California Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,586,652, issued on March 24, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).

"Estimating peak source current using memory die substrate temperature detection" was invented by Keyur Payak (Santa Clara, Calif.), Khin Htoo (Danville, Calif.), Primit Modi (Fremont, Calif.) and Tushar Negi (Milpitas, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments of the present technology provide a memory die that estimates ICC peak using cost effective (and small area) on-memory die components and processing circuitry. The memory die leverages a temperature sensor to estimate a temperature rise for a substrate region of the memory die locat...