US Patent Issued to Sandisk Technologies on March 17 for "Exposed metal loop to detect corrosion in a data storage device" (Indian Inventors)

ALEXANDRIA, Va., March 17 -- United States Patent no. 12,578,260, issued on March 17, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).

"Exposed metal loop to detect corrosion in a data storage device" was invented by Amit Vijayvargiya (Bengaluru, India), Subha Sekhar (Bengaluru, India) and Anoop Thomas (Bengaluru, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A corrosion detection system for a data storage device includes an exposed metal loop provided on a PCB of the data storage device. The corrosion detection system periodically measures an inductance of the exposed metal loop and compares the measured inductance to a reference inductance. If a difference between the measured inductanc...