US Patent Issued to Sandisk Technologies on July 28 for "Binary search bit error rate estimation scan for non-volatile memory apparatus" (California Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,694,942, issued on July 28, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).

"Binary search bit error rate estimation scan for non-volatile memory apparatus" was invented by Salil Kale (San Jose, Calif.), Vishwanath Basavaegowda Shanthakumar (Milpitas, Calif.), Qing Li (Los Gatos, Calif.) and Henry Chin (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A memory apparatus and operating method are provided. The apparatus includes memory cells configured to retain a threshold voltage. A control means is configured to read the memory cells using a primary set of read level offsets and determine a value of an error metric for each...