US Patent Issued to Sandisk Technologies on Feb. 24 for "Smart verify algorithm for improving reliability for ultra high-performance 3D NAND" (California Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,562,231, issued on Feb. 24, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).

"Smart verify algorithm for improving reliability for ultra high-performance 3D NAND" was invented by Kyeongran Yoo (Mountain View, Calif.) and Henry Chin (Fremont, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A memory device has control circuitry that is configured to perform a smart verify operation on the memory cells of a selected word line to acquire an initial programming voltage for programming subsequent word lines. Following completion of the smart verify operation, the control circuitry is configured to adjust a programming voltage by both a step...