ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,869, issued on Sept. 1, was assigned to Samsung SDI Co. Ltd. (Yongin-si, South Korea).
"Clearance measuring apparatus" was invented by Heetaek Lim (Yongin-si, South Korea), Yongseung Shin (Yongin-si, South Korea), Junhaeng Cho (Yongin-si, South Korea), Sungkyun Jung (Yongin-si, South Korea), Seungjun Lee (Yongin-si, South Korea) and Joonkil Kim (Yongin-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "One or more embodiments of the present disclosure provides a clearance-measuring apparatus including an image sensor in a mold including a frame, a punch on the frame and configured to be moved in a vertical direction, and a die on the fra...