ALEXANDRIA, Va., May 19 -- United States Patent no. 12,633,582, issued on May 19, was assigned to SAMSUNG SDI Co. LTD. (Yongin-si, South Korea) and UNIST (Ulsan National Institute of Science and Technology) (Ulsan, South Korea).

"Deformation analysis device and method for secondary battery" was invented by Seong Ho Woo (Yongin-si, South Korea), Dae Sik Kim (Yongin-si, South Korea), Sung Kook Lee (Yongin-si, South Korea), Ji Young Kim (Yongin-si, South Korea), Bo Ram Lee (Yongin-si, South Korea), Hyun-Wook Lee (Ulsan, South Korea), Changhyun Park (Ulsan, South Korea) and Ukhyun Jung (Ulsan, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A deformation analysis device and a non-destructive analysis ...