US Patent Issued to SAMSUNG ELECTRONICS on Sept. 1 for "Second harmonic generation (SHG) measurement device and measurement method using the same" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,863, issued on Sept. 1, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Second harmonic generation (SHG) measurement device and measurement method using the same" was invented by Hidaka Yasuhiro (Yokohama, Japan) and Ingi Kim (Yokohama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement device includes a light source configured to emit a fundamental wave that is a femtosecond pulsed laser beam, a second harmonic generator configured to convert a portion of the fundamental wave into a first-second harmonic, a birefringent crystal configured to split an angle for the first-second harmonic, a wavelength selection ...