ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,754,799, issued on Oct. 6, was assigned to SAMSUNG ELECTRONICS Co. LTD. (South Korea).
"Storage device with data quality metric and selectable data recovery scheme" was invented by Rekha Pitchumani (Oak Hill, Va.) and Zongwang Li (Dublin, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A storage device is disclosed. The storage device may include storage for data. A controller may manage writing the data to the storage and reading the data from the reading storage. A data quality metric table may map a first number of errors to a first data quality metric and map a second number of errors to a second data quality metric. A transmitter may return th...