US Patent Issued to SAMSUNG ELECTRONICS on Oct. 6 for "Methods and apparatus including sampler circuitry for performing offest calibration" (South Korean Inventors)

ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,755,769, issued on Oct. 6, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Methods and apparatus including sampler circuitry for performing offest calibration" was invented by Baek Jin Lim (Suwon-si, South Korea), Youngchul Cho (Gyeonggi-do, South Korea), Seungjin Park (Suwon-si, South Korea), Doobock Lee (Gyeonggi-do, South Korea), Youngdon Choi (Seoul, South Korea) and Junghwan Choi (Gyeonggi-do, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor device according to an embodiment includes a plurality of sampler circuits configured to receive a plurality of offset clock signals or a plurality of divided clo...