US Patent Issued to SAMSUNG ELECTRONICS on Oct. 27 for "Ser-Des test chip and method for managing inter-operability data rate range" (Indian Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,535, issued on Oct. 27, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Ser-Des test chip and method for managing inter-operability data rate range" was invented by Nageswara Rao Kunchapu (Bengaluru, India), Praveen S Bharadwaj (Bengaluru, India) and Somasunder Kattepura Sreenath (Bengaluru, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided a method for managing the inter-operability data rate range of serializer/deserializer (Ser-Des) test chips. The method doubles the inter-operability data rate range of the Ser-Des test chip, reduces the skew on data pins, and thereby increases the performance in the in...