ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,108, issued on Nov. 3, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).
"Semiconductor measurement apparatus" was invented by Younguk Jin (Suwon-si, South Korea), Wookrae Kim (Suwon-si, South Korea), Jinseob Kim (Suwon-si, South Korea), Jinyong Kim (Suwon-si, South Korea), Garam Choi (Suwon-si, South Korea) and Daehoon Han (Suwon-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor measurement apparatus includes lighting unit; a light receiving unit; and a control unit configured to: generate a prediction equation representing the original image, where the prediction equation is based on a plurality of e...