US Patent Issued to SAMSUNG ELECTRONICS on May 12 for "Method and apparatus for beam failure detection, request, and recovery under a unified TCI framework" (Texas, New Jersey Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,628,229, issued on May 12, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Method and apparatus for beam failure detection, request, and recovery under a unified TCI framework" was invented by Dalin Zhu (Allen, Texas), Eko Onggosanusi (Coppell, Texas) and Emad N. Farag (Flanders, N.J.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods and apparatuses for beam failure detection, request, and recovery under a unified transmission configuration indication (TCI) framework in a wireless communication system. A method for operating a user equipment (UE) includes receiving information associated with a transmission configuration indic...