US Patent Issued to SAMSUNG ELECTRONICS on May 12 for "Apparatus for testing image sensor and operating method thereof" (South Korean Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,172, issued on May 12, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Apparatus for testing image sensor and operating method thereof" was invented by Seongkwan Lee (Suwon-si, South Korea), Minho Kang (Suwon-si, South Korea), Hyungsun Ryu (Suwon-si, South Korea), Cheolmin Park (Suwon-si, South Korea) and Jaemoo Choi (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus for testing an image sensor includes a load resistor, a first switch configured to be electrically connected to a first signal line of a device under test and a first end of the load resistor, a second switch configured to be electri...