ALEXANDRIA, Va., March 3 -- United States Patent no. 12,566,662, issued on March 3, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Method and computing device for responding to memory fail" was invented by Jong Won Jeong (Suwon-si, South Korea), Sung-Joon Kim (Suwon-si, South Korea), Il Ho Kim (Suwon-si, South Korea), Won Jae Shin (Suwon-si, South Korea), Ho-Young Lee (Suwon-si, South Korea) and Jin Hun Jeong (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of operating a computing device includes performing a pre-boot memory test on a memory by a BIOS (Basic Input/Output System), recording, in a log, memory fail information generated as a result of perfo...