ALEXANDRIA, Va., March 3 -- United States Patent no. 12,568,224, issued on March 3, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).
"EVC decoding complexity metrics" was invented by Youngkwon Lim (Allen, Texas).
According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus includes a communication interface and a processor operably coupled to the communication interface. The processor is configured to receive, via the communication interface, a bitstream including complexity metrics (CM) metadata. The processor is also configured to extract information in the CM metadata from the bitstream, wherein the information includes a direct indication of a number of coding units (CUs) in the bitstre...