US Patent Issued to SAMSUNG ELECTRONICS on March 24 for "Methods of predicting reliability information of storage devices and methods of operating storage devices" (South Korean Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,586,004, issued on March 24, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Methods of predicting reliability information of storage devices and methods of operating storage devices" was invented by Chanha Kim (Hwaseong-si, South Korea), Youngeun Kim (Yongin-si, South Korea), Kangho Roh (Seoul, South Korea), Younghoon Jung (Seoul, South Korea) and Mijung Cho (Hwaseong-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "In a method of operating a storage device including a plurality of nonvolatile memories, reliability information of the storage device is predicted. A read operation on the storage device is performed b...