US Patent Issued to SAMSUNG ELECTRONICS on March 24 for "Method and apparatus for frequency selective beam measurement and reporting" (Texas, New Jersey Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,587,249, issued on March 24, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Method and apparatus for frequency selective beam measurement and reporting" was invented by Dalin Zhu (Allen, Texas), Emad Nader Farag (Flanders, N.J.), Md. Saifur Rahman (Plano, Texas) and Eko Onggosanusi (Coppell, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods and apparatuses for frequency selective beam measurement and reporting (FSBMR) in a wireless communication system. A method for operating a user equipment (UE) includes receiving a configuration for a channel state information (CSI) reference signal (RS) resource and a CSI reportin...