US Patent Issued to SAMSUNG ELECTRONICS on March 17 for "Test devices and systems that utilize efficient test algorithms to evaluate devices under test" (South Korean Inventors)

ALEXANDRIA, Va., March 17 -- United States Patent no. 12,578,362, issued on March 17, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Test devices and systems that utilize efficient test algorithms to evaluate devices under test" was invented by Jungmin Bak (Suwon-si, South Korea), Junyoung Ko (Suwon-si, South Korea) and Changhwi Park (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test device includes a power supply circuit that is configured to supply an input voltage through a power voltage pin to a memory device under test, and a test controller, which is configured to: (i) transmit a command signal to the memory device, (ii) measure a first current flowing ...