ALEXANDRIA, Va., March 17 -- United States Patent no. 12,581,338, issued on March 17, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).
"Method and apparatus for beam measurement and reporting" was invented by Md. Saifur Rahman (Plano, Texas), Eko Onggosanusi (Coppell, Texas) and Emad N. Farag (Flanders, N.J.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods and apparatuses for beam measurement and reporting. A method for operating a user equipment (UE) includes receiving information about a report, the report including at least one capability value about an uplink (UL) transmission; determining the at least one capability value; determining the report including an indicator indicati...