US Patent Issued to SAMSUNG ELECTRONICS on July 28 for "Defect detecting device and method" (South Korean Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,694,506, issued on July 28, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Defect detecting device and method" was invented by Sungwook Hwang (Suwon-si, South Korea), Tae Soo Shin (Suwon-si, South Korea), Seulgi Ok (Suwon-si, South Korea) and Kibum Lee (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test device includes a memory and a controller. The memory stores reference data including a reference image obtained by photographing a reference pattern on a first semiconductor sample, a first height of the reference pattern, a first shadow length of the reference pattern, and a reference value that represen...