US Patent Issued to SAMSUNG ELECTRONICS on Feb. 24 for "Display driver circuit and defect testing method" (South Korean Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,562,087, issued on Feb. 24, was assigned to SAMSUNG ELECTRONICS Co. Ltd..

"Display driver circuit and defect testing method" was invented by Jeeyeon Eom (Suwon-si, South Korea), In-Suk Kim (Suwon-si, South Korea) and Yeonjeong Lee (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "An example display driving integrated circuit includes a gamma voltage generator, a source driver, gamma lines, a first transistor, and a second transistor. The gamma voltage generator generates gamma voltages. The source driver generates data signals based on the gamma voltages. The gamma lines connect the gamma voltage generator with the source driver, and...