US Patent Issued to SAMSUNG ELECTRONICS on Feb. 24 for "Apparatus for measuring radical density distribution based on light absorption and operating method thereof" (South Korean Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,560,532, issued on Feb. 24, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Apparatus for measuring radical density distribution based on light absorption and operating method thereof" was invented by Sejin Oh (Suwon-si, South Korea), Sunggil Kang (Suwon-si, South Korea), Sangki Nam (Suwon-si, South Korea), Jeongmin Bang (Suwon-si, South Korea), Dougyong Sung (Suwon-si, South Korea), Yeongkwang Lee (Suwon-si, South Korea), Sungho Jang (Suwon-si, South Korea) and Jonghun Pi (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is an apparatus configured to measure radical spatial density distribution includ...