US Patent Issued to SAMSUNG ELECTRONICS on Feb. 17 for "Built-in self test circuit for measuring performance of clock data recovery and system-on-chip including the same" (South Korean Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,553,944, issued on Feb. 17, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Built-in self test circuit for measuring performance of clock data recovery and system-on-chip including the same" was invented by Hobin Song (Suwon-si, South Korea), Juyun Lee (Suwon-si, South Korea), Jiyoung Kim (Suwon-si, South Korea), Jaehyun Park (Suwon-si, South Korea), Sooeun Lee (Suwon-si, South Korea) and Insik Hwang (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system-on-chip includes a clock generation circuit configured to generate a reference clock of a first phase; a transmission circuit comprising a serializer confi...