ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,699,382, issued on Aug. 4, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).
"Method, apparatus, and system with abnormality determination" was invented by Keunseo Kim (Suwon-si, South Korea), Gyungmin Kim (Suwon-si, South Korea) and Sangdo Park (Suwon-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A processor-implemented method of an apparatus or system includes obtaining an expert classification criterion from a memory of the apparatus or system; converting manufacturing process data associated with a manufacturing process to a test sample in a form of an image; generating, using a machine learning model provided the...