ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,633, issued on April 7, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).
"Vulnerability detection method and device" was invented by Jianyun Qu (Shaanxi, China), Yinxiu Guo (Shaanxi, China), Hanbing Zhang (Shaanxi, China) and Mao Zhang (Shaanxi, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "A vulnerability detection method includes obtaining a target test program including system calls and first input parameters corresponding to the system calls required for normal running of a device driver, where the system calls are arranged based on a calling relationship for the normal running of the device driver, obtaining a sequen...