US Patent Issued to SAMSUNG ELECTRONICS on April 7 for "Method and device for performing MDT logging in case of IDC problem in wireless communication system" (South Korean Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,598,007, issued on April 7, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Method and device for performing MDT logging in case of IDC problem in wireless communication system" was invented by Sangyeob Jung (Suwon-si, South Korea) and Himke Van Der Velde (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to a method performed by a user equipment (UE) in a wireless communication system. The method may include receiving, from a base station (BS), configuration information associated with a logged minimization of driving test (MDT), and performing measurement logging in a plurality o...