US Patent Issued to SAMSUNG ELECTRONICS on April 7 for "Circuit analysis method, circuit analysis device, and circuit analysis system" (South Korean Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,859, issued on April 7, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Circuit analysis method, circuit analysis device, and circuit analysis system" was invented by Kwangsun Kim (Suwon-si, South Korea) and Hyungjung Seo (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a circuit analysis method, a circuit analysis device, and a circuit analysis system. An embodiment provides a circuit analysis method, including: building a circuit graph based on a netlist of a circuit; defining a node in the circuit graph; extracting an X (unknown) event for each node based on a waveform built as a result of ...