US Patent Issued to SAMSUNG ELECTRONICS on April 21 for "Method and wireless network for supporting multiple measurement gaps in wireless network" (Indian Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,610,266, issued on April 21, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Method and wireless network for supporting multiple measurement gaps in wireless network" was invented by Aby Kanneath Abraham (Bangalore, India) and Vinay Kumar Shrivastava (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "The disclosure relates to a 5th generation (5G) or 6th generation (6G) communication system for supporting a higher data transmission rate. A method for supporting multiple measurement gaps in a wireless network by a radio access network node (RAN node) is provided. The method includes creating a radio resource control ...